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SM EN 60749-2:2014 Semiconductor devices. Mechanical and climatic test methods. Part 2: Low air pressure
  • Statute : Adopted
  • Effective date : 14.08.2014
  • Is valid? : Yes
  • Available in : English
  • Pages : 18
63.80 lei
Classification of the standard
  • ICS code
  • Name
  • 31.080.01
  • Semiconductor devices in general
Link between documents
  • Link type
  • Notation
  • IDT-identical international
  • IEC 60749-2:2002
  • IDT
  • EN 60749-2:2002

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